IEEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.

IEEE設計與測試提供了描述用于設計和測試微電子系統的模型、方法和工具的原創作品，從設備和電路到完整的片上系統和嵌入式軟件。該雜志專注于當前和近期的實踐，包括教程、入門文章和現實案例研究。該雜志力求通過專欄、訪談和圓桌討論，為讀者帶來重要的技術進步，同時也為技術領導者及其觀點。主題包括半導體集成電路設計、半導體知識產權模塊、設計、驗證和測試技術、制造和生產設計、嵌入式軟件和系統、低功耗和節能設計、電子設計自動化工具、實用技術和標準。